The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2026

Filed:

May. 13, 2022
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Rui Du, Shenzhen, CN;

Huangxun Chen, Hong Kong, CN;

Yuchen Guo, Shenzhen, CN;

Chenchen Liu, Shenzhen, CN;

Meihong Zhang, Shenzhen, CN;

Qian Zhang, Hong Kong, CN;

Xiao Han, Shenzhen, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 24/02 (2009.01); H04B 17/309 (2015.01);
U.S. Cl.
CPC ...
H04W 24/02 (2013.01); H04B 17/309 (2015.01);
Abstract

A first device sends a first message to a second device, where the first message indicates to the second device to hop to different channels at different times to send radio signals. The frequency bandwidth ranges of any two channels do not completely overlap, and the frequency bandwidth range of each channel is within a total frequency bandwidth range supported by the first device. The first device separately receives the radio signals that are sent by the second device on different channels at different times. The radio signals reach the first device after being reflected by an intermediate object. The first device measures the state information of the intermediate object based on the physical characteristics of the different radio signals that are separately received.


Find Patent Forward Citations

Du, Rui. (2026). Method and apparatus for measuring state information of intermediate object (U.S. Patent No. 12750693). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12750693

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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