The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2026
Filed:
Mar. 14, 2024
Dynatrace Llc, Waltham, MA (US);
Wolfgang Beer, Bad Hall, AT;
Thomas Natschlaeger, Hagenberg, AT;
Herwig Moser, Freistadt, AT;
Hans Kohlreiter, Traun, AT;
Abstract
A technology is disclosed for fast and straightforward development of complex, multi-layered analysis processes for semi-structured application monitoring data. The analysis process is divided into sub-tasks, like moving to/identifying portions of monitoring data that needs to be analyzed and performing statistical analyses on identified monitoring data portions. Generic, configurable analysis components performing those sub-tasks are provided. Those analysis components include interfaces to access monitoring data, to communicate analysis results with other analysis components, and to provide visualization data for the results of performed analyses. An analysis process definition language is used to compose networks of interacting analysis nodes, which in cooperation implement arbitrarily complex analysis tasks. An interactive analysis design environment combines means to configure and interconnect those analysis components with their capability. The design environment provides analysis result visualization data to create a 'WYSIWYG'-like design experience for complex analysis processes.