The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2026
Filed:
Nov. 22, 2023
Applicant:
Mediatek Inc., Hsinchu, TW;
Inventors:
Pedram Kheirkhah Sangdeh, San Jose, CA (US);
Gyu Bum Kyung, San Jose, CA (US);
Assignee:
MEDIATEK INC., Hsinchu, TW;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/26 (2015.01); H04B 7/06 (2006.01); H04B 17/391 (2015.01);
U.S. Cl.
CPC ...
H04B 7/0626 (2013.01); H04B 17/26 (2015.01); H04B 17/3913 (2015.01);
Abstract
In an aspect of the disclosure, a method, a computer-readable medium, and an apparatus are provided. The apparatus may be a user equipment (UE). The UE generates metadata for channel state information (CSI) samples. The UE uses the generated metadata to categorize the CSI samples into one or more subsets. The UE uses each subset of the one or more subsets to train a machine learning model or a part of a machine learning model.
Quick Actions:
Sangdeh, Pedram. (2026). Metadata generation for artificial intelligence (ai) / machine learning (ml) models (U.S. Patent No. 12750109). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12750109
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile