The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2026
Filed:
May. 23, 2024
Applicant:
Adeia Imaging Llc, San Jose, CA (US);
Inventors:
Jean-Yves Couleaud, Mission Viejo, CA (US);
Reda Harb, Tampa, FL (US);
Assignee:
Adeia Imaging LLC, San Jose, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 11/60 (2026.01); G06T 7/11 (2017.01); G06V 10/25 (2022.01); G06V 10/44 (2022.01);
U.S. Cl.
CPC ...
G06T 11/60 (2013.01); G06T 7/11 (2017.01); G06V 10/25 (2022.01); G06V 10/443 (2022.01);
Abstract
A region of interest is determined based on metadata associated with an image. The region of interest is then sliced into a plurality of slices. POI information is retrieved for each respective slice. An overlay for at least one POI is then generated for display over the image.
Couleaud, Jean-Yves. (2026). Systems and methods for real-time point-of-interest detection and overlay (U.S. Patent No. 12749282). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12749282
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile