The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2026

Filed:

Sep. 27, 2023
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Masataka Sugahara, Tokyo, JP;

Koji Taninai, Tokyo, JP;

Yuji Jibiki, Tokyo, JP;

Tatsuya Taneichi, Tokyo, JP;

Hisatsugu Horiuchi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/70 (2017.01); A61B 6/00 (2006.01); A61B 6/08 (2006.01); G06T 7/00 (2017.01); G06V 10/25 (2022.01);
U.S. Cl.
CPC ...
G06V 10/25 (2022.01); A61B 6/52 (2013.01); G06T 7/0012 (2013.01); G06T 7/70 (2017.01); G06T 2207/10116 (2013.01); G06T 2207/20044 (2013.01); G06T 2207/30092 (2013.01);
Abstract

An information processing apparatus comprising at least one processor, wherein the processor is configured to: acquire at least one optical image obtained by optically imaging a subject from a first direction; estimate a position of at least one first region of interest based on the optical image; acquire a plurality of radiation images obtained by continuously performing radiography of a state in which the subject swallows a sample from the first direction; specify a second region of interest corresponding to the position of the first region of interest in the radiation image; monitor a position of the sample based on the plurality of radiation images; and change an imaging condition for the radiography based on a positional relationship between the second region of interest and the sample.


Find Patent Forward Citations

Loading…