The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2026

Filed:

Feb. 05, 2024
Applicant:

Toyota Jidosha Kabushiki Kaisha, Toyota, JP;

Inventor:

Emily Lerner, Ypsilanti, MI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B60W 50/02 (2012.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01);
Abstract

A method for examining a condition of a vehicle sensor may include collecting a first data point from a first sensor at a first data collection point, wherein the first sensor is configured on a vehicle, determining a location of the first data collection point, comparing the first data point to a previously collected data point from the first sensor from a second data collection point, wherein the first data collection point and the second data collection point are within a predetermined distance of one another, and determining a condition of the first sensor.


Find Patent Forward Citations

Lerner, Emily. (2026). Methods for examining a condition of a sensor (U.S. Patent No. 12749168). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12749168

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…