The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2026

Filed:

Jun. 12, 2024
Applicant:

Aspeed Technology Inc., Hsinchu City, TW;

Inventors:

Hsin-Hui Chen, Hsinchu City, TW;

Hsin Yu Chen, Hsinchu City, TW;

Assignee:

ASPEED Technology Inc., Hsinchu City, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 3/4038 (2024.01); G06T 5/50 (2006.01); G06T 5/92 (2024.01);
U.S. Cl.
CPC ...
G06T 5/92 (2024.01); G06T 3/4038 (2013.01); G06T 5/50 (2013.01);
Abstract

A method for adjusting exposure parameters of images to be spliced and an image analyzing device are provided. The method includes: obtaining N images to be spliced into a panoramic image; obtaining a first brightness value of a first overlapping area and a second brightness value of a second overlapping area of each of the N images, and accordingly determining a first brightness ratio value and a second brightness ratio value of each of the N images; and determining a brightness ratio difference of each of the N images based on the first brightness ratio value and the second brightness ratio value of each of the N images, and accordingly updating an exposure parameter corresponding to each of the N images.


Find Patent Forward Citations

Chen, Hsin-Hui. (2026). Method for adjusting exposure parameters of images to be spliced and image analyzing device (U.S. Patent No. 12749167). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12749167

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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