The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2026

Filed:

Jan. 29, 2024
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventor:

Masanori Ouchi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/50 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 5/50 (2013.01); G06T 7/0004 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20092 (2013.01); G06T 2207/30148 (2013.01);
Abstract

To implement image synthesis without loss of surface information of SE images and shadow information of BSE images, the present disclosure proposes image processing techniques include applying data of a first quality image (low quality image) to a trained model, estimating a structural feature and a material feature of a second quality image (high quality image) corresponding to the first quality image, calculating at least one shadow datum based on the structural feature and a synthesis parameter and calculating at least one gradation datum based on the material feature and a synthesis parameter, generating a synthesized image from the at least one shadow datum and the at least one gradation datum, and outputting the synthesized image as a prediction result of the second quality image (see FIG.).


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