The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2026

Filed:

Sep. 20, 2023
Applicant:

Tata Consultancy Services Limited, Mumbai, IN;

Inventors:
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/20 (2019.01);
U.S. Cl.
CPC ...
G06N 20/20 (2019.01);
Abstract

Perturbed data generation for explainable Artificial Intelligence (AI) is still an evolving field and attempts are made towards to addressing the technical challenge of correlation of features that degrades generated explanations for block box models in Machine Learning (ML) or AI domain. A method and system for local explanation of black box model based on constrained perturbation and ensemble-based surrogate model is disclosed. The method disclosed averts data correlation problem by performing data perturbation around the local instance in accordance with distribution of test data set and primarily ensures the values of input features associated with the local instance stay within the feature space and does not form out of distribution scenarios (add adversary cheating). The method autogenerates labels for the perturbed data to fit or train an ensemble based surrogate model that eliminates data bias and improves accuracy of generated explanations.


Find Patent Forward Citations

Bansal, Krishna. (2026). Local explanation of black box model based on constrained perturbation and ensemble-based surrogate model (U.S. Patent No. 12749025). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12749025

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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