The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2026

Filed:

Dec. 08, 2022
Applicant:

Optum, Inc., Minnetonka, MN (US);

Inventors:

Arun Tiwari, Delhi, IN;

Amardeep Sharma, Uttar Pradesh, IN;

Rahul Pathak, Uttar Pradesh, IN;

Sudhanshu Sharma, Bangalore, IN;

Urvi Sharma, Uttar Pradesh, IN;

Radhika Agarwal, West Bengal, IN;

Assignee:

Optum, Inc., Minnetonka, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01);
Abstract

Various embodiments of the present disclosure disclose machine-learning based evaluation techniques for detecting feature bias. An evaluation framework is provided that utilizes new evaluation data structures for comprehensibly evaluating feature bias in machine learning models. The evaluation framework includes receiving evaluation dataset for a machine learning model that includes one or more different feature classes of an evaluation feature. The evaluation framework includes generating, using an evaluation function, at least two performance metrics for the machine learning model and generating a unitless dissimilarity metric for the evaluation feature based at least in part on the first performance metric, the second performance metric, and an average between the first and second performance metrics. In this way, the unitless dissimilarity metric is based on a variability associated with the evaluation feature.


Find Patent Forward Citations

Tiwari, Arun. (2026). Machine learning evaluation for detecting feature bias (U.S. Patent No. 12749016). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12749016

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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