The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2026

Filed:

Aug. 10, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

A Peng Zhang, Xian, CN;

Lei Gao, Xian, CN;

Jin Wang, Xi'an, CN;

Jia Xing Tang, Xian, CN;

Kai Li, Xian, CN;

Geng Wu Yang, Xian, CN;

Zhen Liu, Xian, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 8/60 (2018.01); G06F 11/34 (2006.01); G06F 11/3668 (2025.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 8/60 (2013.01); G06F 11/3452 (2013.01); G06F 11/3684 (2013.01); G06F 11/3688 (2013.01); G06F 11/3692 (2013.01);
Abstract

An approach is provided in which the approach loads a machine learning model and a set of test case statistical data into a user system. The set of test case statistical data is based on a set of test cases corresponding to the machine learning model and includes a plurality of input parameter sets and a corresponding set of output quality measurements. The approach compares user data on the user system against the set of test case statistical data and identifies one of the plurality of input parameter sets to optimize the machine learning model based on the set of output quality measurements. The approach generates an optimized machine learning model using the machine learning model and the identified input parameter set at the user system.


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