The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2026
Filed:
Nov. 09, 2020
Omron Corporation, Kyoto, JP;
Kyoto University, Kyoto, JP;
Atsushi Hashimoto, Tokyo, JP;
Masaaki Iiyama, Kyoto, JP;
Ryuhei Takahashi, Kyoto, JP;
Motoharu Sonogashira, Kyoto, JP;
OMRON CORPORATION, Kyoto, JP;
KYOTO UNIVERSITY, Kyoto, JP;
Abstract
An inference system includes: a learning unit that generates an inference model using a first dataset including a plurality of sample data whose ground truth is given and a second dataset including a plurality of sample data whose ground truth is not given; and an inference unit that determines an inference result. The inference model includes an encoder that calculates from sample data a first feature value independent of the first and second datasets and a second feature value dependent on the first or second dataset. The learning unit trains the encoder such that the same first feature value is calculated from any of first and second sample data for a pair of the first sample data among the first dataset and the second sample data which is among the second dataset and whose ground truth is to be identical to the ground truth of the first sample data.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile