The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2026
Filed:
Jul. 12, 2024
Acer Incorporated, New Taipei City, TW;
Pei-Jung Chen, New Taipei City, TW;
Tsung-Hsien Tsai, New Taipei City, TW;
Ke-Han Pan, New Taipei City, TW;
Yun-Hsuan Chan, New Taipei City, TW;
Sheng-Wei Chu, New Taipei City, TW;
Pin-Cyuan Lin, New Taipei City, TW;
ACER INCORPORATED, New Taipei City, TW;
Abstract
A data processing method for the machine learning and an electronic device using the same are provided. The data processing method for the machine learning includes the following steps. For a plurality of sources, a source balancing procedure is performed on an original measuring data to obtain a balanced distribution map. For each of the subjects, a personalization scaling procedure is performed on a plurality of detection values to obtain a personalized scaled measuring data. For each of the sources, a source scaling procedure is performed on the detection values to obtain a by-source scaled measuring data. The balanced distribution map, the personalized scaled measuring data and the by-source scaled measuring data are combined to obtain a balanced personalized scaled data and a balanced by-source scaled data. Based on the balanced personalized scaled data and the balanced by-source scaled data, some of the detection items are outputted.