The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2026
Filed:
Jun. 26, 2024
Revefi, Inc., Sammamish, WA (US);
Sanjay Agrawal, Sammamish, WA (US);
Shashank Gupta, Sammamish, WA (US);
Pramod Kalipatnapu, Sammamich, WA (US);
Revefi, Inc., Sammamish, WA (US);
Abstract
An automated data observation system, platform, and corresponding methods and non-transitory computer readable medium include periodically obtaining metadata, automatically generating data quality metrics, obtaining predicted values for the data quality metrics, determining a first anomaly, generating a data pipeline graph, and estimating a root cause relating to the first anomaly by traversing the data pipeline graph. Obtaining predicted values for the data quality metrics includes executing a plurality of candidate machine learning models over time series data relating to the data quality metrics to generate candidate predicted values and selecting a machine learning model for a given data quality metric based on the candidate predicted values and measured values.