The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2026
Filed:
Oct. 30, 2020
Hitachi Vantara Llc, Santa Clara, CA (US);
Yongqiang Zhang, Lexington, MA (US);
Wei Lin, Plainsboro, NJ (US);
William Schmarzo, Palo Alto, CA (US);
HITACHI VANTARA LLC, Santa Clara, CA (US);
Abstract
Example implementations described herein are directed to management of a system comprising a plurality of apparatuses providing unlabeled sensor data, which can involve executing feature extraction on the unlabeled sensor data to generate a plurality of features; executing failure detection by processing the plurality of features with a failure detection model to generate failure detection labels, the failure detection model generated from a machine learning framework that applies supervised machine learning on unsupervised machine learning models generated from unsupervised machine learning; and providing extracted features and the failure detection label to a failure prediction model to generate failure prediction and a sequence of features.