The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2026
Filed:
Aug. 14, 2023
Nutech Ventures, Lincoln, NE (US);
Ut-battelle, Llc, Oak Ridge, TN (US);
Ruiguo Yang, Lincoln, NE (US);
Grayson Minnick, Lincoln, NE (US);
Nickolay Lavrik, Knoxville, TN (US);
Jordan Daniel Rosenbohm, Lincoln, NE (US);
Amir Monemian Esfahani, Lincoln, NE (US);
Bahareh Tajvidi Safa, Lincoln, NE (US);
NUtech Ventures, Lincoln, NE (US);
UT-BATTELLE, LLC, Oak Ridge, TN (US);
Abstract
A method of measuring a stress-strain curve in a sample, the method including: providing a structure including a first movable island supported by a first beam, a second movable island supported by a second beam, and a gap therebetween connected by a sample, the sample including an initial length; moving the second movable island with a defined displacement; determining a displacement of the first movable island based on moving the second movable island; calculating a difference between the displacement of the first movable island and the defined displacement of the second movable island based on moving the second movable island; determining an applied strain in the sample based on the difference divided by the initial length of the sample; calculating a force on the sample based on the displacement of the first movable island; calculating a stress on the sample based on the force; and determining the stress-strain curve of the sample by plotting the calculated stress against the applied strain.