The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2026

Filed:

Dec. 08, 2022
Applicant:

Thermo Electron Scientific Instruments Llc, Madison, WI (US);

Inventors:

Margaret E. Robinson, Monona, WI (US);

Damian W. Ashmead, Middletown, DE (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/03 (2006.01); B82Y 30/00 (2011.01); G01J 3/10 (2006.01); G01N 21/956 (2006.01);
U.S. Cl.
CPC ...
G01N 21/95684 (2013.01); B82Y 30/00 (2013.01); G01J 3/10 (2013.01); G01N 21/03 (2013.01); G01N 2021/035 (2013.01);
Abstract

System and methods for spectrophotometers are described that can utilize ferrules configured to hold a sample test droplet therebetween via surface tension. Light sources in the systems can shine a light on the test droplet and an output of reflected or refracted light can be measured, which can assist in various testing and analysis procedures. Nanoscale or microscale structures can be incorporated on the ferrules to create hydrophobic or superhydrophobic surfaces. This helps prevent test droplets from wetting the ferrules surfaces and helps prevent polluting or mixing of test materials. The ferrules can therefore achieve certain self-cleaning capabilities and test results are more accurate.


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