The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2026

Filed:

Jun. 23, 2022
Applicant:

Safran, Paris, FR;

Inventor:

Franck Michaud, Moissy-Cramayel, FR;

Assignee:

SAFRAN, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8851 (2013.01); G01N 21/8806 (2013.01); G01N 21/95 (2013.01); G01N 2021/8848 (2013.01); G01N 2201/0633 (2013.01);
Abstract

A method for inspecting the surface finish of a cast part made of single-crystal metal, the surface of the part potentially containing defects resulting from an inhomogeneity of orientation of at least a crystal lattice of the single-crystal metal, the method including acquiring, using an image-acquiring device, a series of images of the cast part illuminated by a polarized and collimated illuminating device, then analysing the series of images by an image-processing device, each image of the series of images being taken at a different polarization angle.


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