The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2026
Filed:
May. 31, 2023
Samsung Display Co., Ltd., Yongin-si, KR;
Myoungchul Kim, Yongin-si, KR;
Tae-Gu Kang, Yongin-si, KR;
Byoung-Ju Kim, Yongin-si, KR;
Hyojin Kim, Yongin-si, KR;
Seungbum Park, Yongin-si, KR;
Jihoon Seo, Yongin-si, KR;
Tae-Jun Ahn, Yongin-si, KR;
Sangsu Lee, Yongin-si, KR;
Hyoyul Lee, Yongin-si, KR;
Jeonghwa Ha, Yongin-si, KR;
SAMSUNG DISPLAY CO., LTD., Gyeonggi-Do, KR;
Abstract
An inspection device includes an imaging unit which captures an inspection target and outputs image data corresponding to the inspection target, a data extraction unit which receives the image data and extracts inspection data corresponding to an inspection area of the inspection target from the image data, a setting unit which sets a threshold value based on a grayscale value of comparative data compared with the inspection data, and an inspection unit which determines whether the inspection target is defective based on the threshold value.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile