The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2026

Filed:

Sep. 29, 2022
Applicant:

Hamamatsu Photonics K.k., Hamamatsu, JP;

Inventors:

Osamu Yasuhiko, Hamamatsu, JP;

Kozo Takeuchi, Hamamatsu, JP;

Hidenao Yamada, Hamamatsu, JP;

Assignee:

HAMAMATSU PHOTONICS K.K., Hamamatsu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/45 (2006.01); G01N 21/41 (2006.01); G01N 15/14 (2006.01);
U.S. Cl.
CPC ...
G01N 21/45 (2013.01); G01N 21/4133 (2013.01); G01N 15/14 (2013.01);
Abstract

An observation apparatus includes a light source, a beam splitter, a mirror, a mirror, a cylindrical lens, a lens, a cylindrical lens, a beam splitter, a lens, a frequency shifter, an imaging unit, and an analysis unit. The analysis unit generates a complex amplitude image of each of a plurality of light irradiation directions of object light based on time series data of an interference intensity image output from the imaging unit, and generates a three-dimensional complex differential interference image of an observation object based on the complex amplitude image of each of the plurality of light irradiation directions. The analysis unit obtains a three-dimensional phase image of the observation object based on the three-dimensional complex differential interference image.


Find Patent Forward Citations

Yasuhiko, Osamu. (2026). Observation device and observation method (U.S. Patent No. 12748047). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12748047

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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