The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2026
Filed:
Jul. 20, 2023
Applicant:
Fenwal, Inc., Lake Zurich, IL (US);
Inventor:
Benjamin E. Kusters, Pleasant Prairie, WI (US);
Assignee:
Fenwal, Inc., Lake Zurich, IL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/31 (2006.01); G01N 1/40 (2006.01); G01N 33/49 (2006.01);
U.S. Cl.
CPC ...
G01N 21/31 (2013.01); G01N 1/4077 (2013.01); G01N 33/491 (2013.01); G01N 2001/4083 (2013.01); G01N 2201/08 (2013.01);
Abstract
An optical plasma grading system includes a broadband light source configured to emit light having wavelengths in a visible spectrum, an optical spectrometer configured to receive a reflected portion of the emitted light and analyze at least a portion of the received, reflected light to determine a main wavelength of the portion of the received reflected light, and a controller operably connected to the optical spectrometer, the controller configured to determine a plasma grade of the plasma based at least upon the main wavelength of the plasma.