The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2026

Filed:

Jun. 24, 2024
Applicant:

Yokogawa Electric Corporation, Tokyo, JP;

Inventor:

Takeshi Sawada, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/21 (2006.01); G01N 21/85 (2006.01);
U.S. Cl.
CPC ...
G01N 21/21 (2013.01); G01N 21/85 (2013.01); G01N 2201/0636 (2013.01);
Abstract

Provided is an optical system including: a first linear polarizer of a reflection type which receives linearly polarized light transmitted through a sample; and a switching unit which controls a polarization direction of the first linear polarizer, to switch between causing the linearly polarized light received by the first linear polarizer to be transmitted and reflected, where the number of times that light transmitted through the first linear polarizer is transmitted through the sample before reaching an optical receiver is different from the number of times that light reflected by the first linear polarizer is transmitted through the sample before reaching the optical receiver.


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Sawada, Takeshi. (2026). Optical systems and optical measuring apparatus (U.S. Patent No. 12748038). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12748038

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