The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2026

Filed:

Sep. 11, 2023
Applicant:

Harvest Croo, Llc, Plant City, FL (US);

Inventors:

Robert Henry Pitzer, Tampa, FL (US);

Alexander Scott Bicigo, Tampa, FL (US);

Santosh Bhusal, Brandon, FL (US);

Assignee:

HARVEST CROO, LLC, Plant City, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B65B 25/04 (2006.01); A01D 46/00 (2006.01); B65B 1/22 (2006.01); B65B 1/32 (2006.01);
U.S. Cl.
CPC ...
B65B 25/045 (2013.01); A01D 46/00 (2013.01); B65B 1/22 (2013.01); B65B 1/32 (2013.01); B65B 25/046 (2013.01);
Abstract

A system including one or more inspectors each configured to automatically inspect crops individually to classify the crops into a classification including two or more classes. The system also can include one or more respective separators associated with each of the one or more inspectors. The one or more respective separators can be configured to automatically physically separate the crops into two or more areas based on the classification. Other embodiments are described.


Find Patent Forward Citations

Pitzer, Robert. (2026). Automated inspection of crops (U.S. Patent No. 12747050). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12747050

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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