The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2026
Filed:
Sep. 26, 2023
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventors:
Yuji Ishikawa, Matsumoto, JP;
Toshifumi Sakai, Shiojiri, JP;
Assignee:
Seiko Epson Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B33Y 30/00 (2015.01); B29C 64/10 (2017.01); B29C 64/386 (2017.01); B33Y 10/00 (2015.01);
U.S. Cl.
CPC ...
B29C 64/386 (2017.08); B29C 64/10 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12);
Abstract
A printing system including: a scanner configured to scan a pattern on a surface of a three-dimensional object; a selection section configured to select a three-dimensional print medium corresponding to the three-dimensional object in accordance with scan data; and a print section configured to form a pattern on a surface of the selected print medium in accordance with the scan data to replicate the three-dimensional object.
Ishikawa, Yuji. (2026). Printing system and method of producing replica (U.S. Patent No. 12746720). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12746720
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile