The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2026
Filed:
Nov. 14, 2024
Rtx Corporation, Farmington, CT (US);
Robert Koch, Hartford, CT (US);
Derek Bialka, Ellington, CT (US);
RTX Corporation, Farmington, CT (US);
Abstract
During a manufacturing method, a component is scanned with one or more artifacts using a computed tomography machine. The component includes a first member and a second member covering the first member. The first member includes a first member aperture extending through the first member to the second member. Scan data is scaled using known dimensional data for the one or more artifacts to provide scaled scan data. Aperture data is determined for the first member aperture based on the scaled scan data. The aperture data is indicative of a scanned geometry of the first member aperture. A first drilling reference is determined based on the aperture data. A second member aperture is formed in the second member according to a formation operation that aligns the second member aperture being formed with the first member aperture in the first member. The formation operation is determined using the first drilling reference.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile