The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2026
Filed:
Dec. 05, 2024
Fujifilm Corporation, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided are a PCCT apparatus and a control method thereof capable of improving an interpolation accuracy related to substance discrimination and shortening a processing time. A PCCT apparatus includes: a scanner that rotates an X-ray source that irradiates a subject with X-rays and a photon counting detector that detects the X-rays transmitted through the subject for each of a plurality of energy bins around the subject; an image generation unit that generates a tomographic image using projection data calculated based on an output of the photon counting detector; a map creation unit that creates a calibration data map based on the number of X-ray photons transmitted through each of a plurality of calibration phantoms having a first basal substance and a second basal substance of which a material and a thickness are known; a region division unit that divides the calibration data map into a non-linear region and a linear region; and an interpolation unit that performs non-linear interpolation in the non-linear region and performs linear interpolation in the linear region.