The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2026
Filed:
Dec. 07, 2023
GE Precision Healthcare Llc, Waukesha, WI (US);
Chao Zhu, Beijing, CN;
Hongjiang Li, Beijing, CN;
Qiong Li, Beijing, CN;
Lin Lin, Beijing, CN;
Yan Wang, Beijing, CN;
GE Precision Healthcare LLC, Waukesha, WI (US);
Abstract
The present application provides an X-ray imaging system and an X-ray imaging method for dynamic examination. The X-ray imaging system comprises: a first camera and a control apparatus; the first camera being used to acquire a first optical image of an object under examination, and the control apparatus comprising a protocol selection unit, a pose determination unit and an exposure control unit; the protocol selection unit is used to select a corresponding protocol based on information of the object under examination, the protocol at least comprising a preset pose for exposure and an exposure site; the pose determination unit is used to identify key points on the first optical image, and to determine, based on the key points, whether the pose of the object under examination satisfies the preset pose; and the exposure control unit is configured to control exposure when the preset pose is satisfied and the location of the exposure site of the object under examination is within an exposure range, so as to acquire an X-ray image corresponding to the preset pose.