The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 2026

Filed:

Nov. 04, 2024
Applicants:

University of Central Florida Research Foundation, Inc., Orlando, FL (US);

New Jersey Institute of Technology, Newark, NJ (US);

Inventors:

Francisco Guido-Sanz, Orlando, FL (US);

Mindi Anderson, Orlando, FL (US);

Desiree Diaz, Orlando, FL (US);

Steven Talbert, Orlando, FL (US);

Salam Daher, Newark, NJ (US);

Dahlia Musa, Newark, NJ (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); G16H 10/60 (2018.01); G16H 50/50 (2018.01); G16H 80/00 (2018.01);
U.S. Cl.
CPC ...
A61B 5/445 (2013.01); A61B 5/0064 (2013.01); A61B 5/0073 (2013.01); A61B 5/444 (2013.01); A61B 5/7425 (2013.01); G16H 10/60 (2018.01); G16H 50/50 (2018.01); G16H 80/00 (2018.01);
Abstract

A method of skin anomaly assessment, measurement, and monitoring is disclosed. The three-dimensional topology of a skin anomaly is digitally scanned, and a three-dimensional model of the skin anomaly is computationally constructed. From the three-dimensional model, length, width, depth, perimeter, and surface area measurements of the skin anomaly are derived. This information may be quantified by volume surface area, and/or distance along the surface of the anomaly, and measured against models of anticipated healing for medical monitoring and training.


Find Patent Forward Citations

Guido-Sanz, Francisco. (2026). System to visualize, measure, and track skin abnormalities (U.S. Patent No. 12745952). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12745952

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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