The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2026

Filed:

May. 28, 2024
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Yosuke Kajiwara, Yokohama, JP;

Masahiko Kuraguchi, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10P 14/20 (2026.01); H10D 62/40 (2025.01); H10D 62/85 (2025.01); H10D 64/00 (2025.01);
U.S. Cl.
CPC ...
H10P 14/3216 (2026.01); H10D 62/40 (2025.01); H10D 62/8503 (2025.01); H10D 64/00 (2025.01);
Abstract

According to one embodiment, a semiconductor device includes a first transistor, and a first mounting member. The first transistor includes a nitride semiconductor layer and includes a first element electrode, a second element electrode, and a third element electrode. The first mounting member includes a first frame electrode, a plurality of first frame connection members electrically connecting the first element electrode and the first frame electrode, a first pad electrode, and a first pad connection member electrically connecting the first element electrode and the first pad electrode.


Find Patent Forward Citations

Kajiwara, Yosuke. (2026). Semiconductor device, inspection apparatus of semiconductor device, and method for inspecting semiconductor device (U.S. Patent No. 12745576). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12745576

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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