The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2026

Filed:

Jul. 09, 2021
Applicant:

Nokia Technologies Oy, Espoo, FI;

Inventors:

Navin Hathiramani, Dallas, TX (US);

Claudio Rosa, Aalborg, DK;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 36/00 (2009.01);
U.S. Cl.
CPC ...
H04W 36/0088 (2013.01); H04W 36/0061 (2013.01);
Abstract

Systems, methods, apparatuses, and computer program products for handling measurement gaps for frame based equipment (FBE) operation are provided. One method may include receiving at a user equipment, from a serving cell, assistance information that includes at least one of a fixed frame period (FFP) configuration of the serving cell, a reference signal timing configuration for at least one neighbor cell and system frame number (SFN) and frame timing difference reporting information for the at least one neighbor cell. The method may also include determining whether there is transmission from the serving cell during a period of time and, in accordance with a determination that there is no transmission from the serving cell during the period of time, based at least on the assistance information, performing measurement of the at least one neighbor cell during the period of time.


Find Patent Forward Citations

Hathiramani, Navin. (2026). Unconfigured measurement gaps handling for frame based equipment (fbe) operation (U.S. Patent No. 12745145). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12745145

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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