The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2026
Filed:
Feb. 26, 2024
Applicant:
Huawei Technologies Co., Ltd., Shenzhen, CN;
Inventors:
Assignee:
HUAWEI TECHNOLOGIES CO., LTD., Shenzhen, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01); H04W 24/02 (2009.01); H04W 72/0446 (2023.01); H04W 72/21 (2023.01); H04W 72/53 (2023.01);
U.S. Cl.
CPC ...
H04W 24/02 (2013.01); H04W 72/0446 (2013.01); H04W 72/21 (2023.01); H04W 72/53 (2023.01);
Abstract
Embodiments of this application provide a measurement method, an apparatus, and a system, so that when a time domain resource for layer 1 measurement and a configured time domain resource for layer 3 measurement overlap, the layer 1 measurement can be preferentially performed, thereby reducing a layer 1 measurement delay. The method includes: A terminal device obtains a first parameter associated with a first portion of a first time resource for a layer 1 measurement to a second time domain resource for a layer 3 measurement, determines first duration based on the first parameter perform the layer 1 measurement.