The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2026

Filed:

Apr. 03, 2025
Applicant:

Elbit Systems Electro-optics—elop Ltd., Rehovot, IL;

Inventors:

Eliyahu Benny, Rehovot, IL;

Uriel Ankor, Rehovot, IL;

Michael Gilichinsky, Rehovot, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/11 (2023.01); G06V 10/58 (2022.01); G06V 10/70 (2022.01); G06V 20/10 (2022.01); H04N 23/12 (2023.01); H04N 23/73 (2023.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
H04N 23/11 (2023.01); G06V 10/58 (2022.01); G06V 10/70 (2022.01); G06V 20/10 (2022.01); H04N 23/12 (2023.01); H04N 23/73 (2023.01); G06V 2201/07 (2022.01); H04N 17/00 (2013.01);
Abstract

A system for detecting one or more target materials in an un-calibrated multi-spectral data cube comprising a collection of pixels, the system comprising a processing circuitry configured to: obtain: (A) a machine learning model capable of receiving the un-calibrated multi-spectral data cube and determining for at least one pixel of the pixels at least one material indicator, indicative of existence of a given target material of the target materials at the location of the pixel, wherein the machine learning model is trained utilizing a labeled training-data set comprising of a plurality of training records, each training record comprising: (i) a training un-calibrated multi-spectral data cube, and (ii) at least one training material indicator associated with at least one pixel of the training un-calibrated multi-spectral data cube, indicative of existence of the target material at the location of the pixel, and (B) the un-calibrated multi-spectral data cube; and determine for at least one pixel of the pixels of the un-calibrated multi-spectral data cube, at least one material indicator, and a corresponding calibrated multi-spectral data cube, wherein the corresponding calibrated multi-spectral data cube is calculated by utilizing a calibration process and an atmospheric simulator that simulates a plurality of simulated un-calibrated multi-spectral data cubes by simulation of different atmospheric conditions over the calibrated multi-spectral cube.


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