The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2026
Filed:
Apr. 05, 2024
Applicant:
Tadashi Kitai, Kanagawa, JP;
Inventor:
Tadashi Kitai, Kanagawa, JP;
Assignee:
RICOH COMPANY, LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/58 (2006.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00045 (2013.01); H04N 1/00029 (2013.01); H04N 1/00411 (2013.01); H04N 1/00726 (2013.01); H04N 2201/0094 (2013.01);
Abstract
A print inspection apparatus include circuitry that generates a difference image based on a comparison between a read image obtained by reading printed matter printed by a printer and a reference image, and inspects a defect of the printed matter using the difference image, a plurality of size thresholds, and a plurality of density thresholds corresponding to each of the plurality of size thresholds.