The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2026

Filed:

Mar. 30, 2023
Applicant:

Contemporary Amperex Technology (Hong Kong) Limited, Hong Kong, CN;

Inventors:

Xiangqiang Huang, Ningde, CN;

Yinyong Qiao, Ningde, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01M 4/04 (2006.01); H01M 4/139 (2010.01); H01M 4/02 (2006.01);
U.S. Cl.
CPC ...
H01M 4/0435 (2013.01); H01M 4/139 (2013.01); H01M 2004/021 (2013.01);
Abstract

The present application provides a measurement device and an electrode plate production system. The measurement device includes an unwinding mechanism, an adjustment mechanism, a measurement mechanism and a winding mechanism. The unwinding mechanism is configured to unwind a material tape. The adjustment mechanism is arranged downstream of the unwinding mechanism and configured to adjust a tensioning force of the material tape so that the material tape forms a tensioned area. The measurement mechanism is configured to measure the size of the tensioned area. The winding mechanism is arranged downstream of the adjustment mechanism and configured to wind up the material tape. The adjustment mechanism of the measurement device can adjust the tensioning force of the material tape and keep the material tape under a preset tensioning force. Measuring results of the measurement device can provide an accurate feedback on the size of the material tape.


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