The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2026
Filed:
Jul. 23, 2020
Applicant:
Miraterra Inc., Lewes, DE (US);
Inventors:
Diane Wu, San Francisco, CA (US);
Poornima Parameswaran, Menlo Park, CA (US);
Assignee:
MIRATERRA INC., Lewes, DE (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16B 40/00 (2019.01); G06N 20/00 (2019.01); G16B 25/00 (2019.01); G16H 50/20 (2018.01);
U.S. Cl.
CPC ...
G16B 40/00 (2019.02); G06N 20/00 (2019.01); G16B 25/00 (2019.02); G16H 50/20 (2018.01);
Abstract
A system and method for the detection of pathogens and other microbes using nucleotide analysis is described. Aligned and unaligned nucleotide sequences are utilized to predict the presence or absence of pathogens and other microbes.
Wu, Diane. (2026). System and method for nucleotide analysis and prediction of disease risk (U.S. Patent No. 12744107). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12744107
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile