The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2026

Filed:

Jul. 25, 2024
Applicant:

Jvckenwood Corporation, Yokohama, JP;

Inventor:

Hideki Takehara, Yokohama, JP;

Assignee:

JVCKENWOOD Corporation, Yokohama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/764 (2022.01); G06V 10/44 (2022.01);
U.S. Cl.
CPC ...
G06V 10/764 (2022.01); G06V 10/44 (2022.01);
Abstract

A feature extraction unit extracts a low-resolution general feature vector of an input image and a high-resolution detailed feature vector of the input image. A general feature distance measurement unit maintains a general weight vector of each class and calculates a general distance vector from the general feature vector and the general weight vector. A detailed feature distance measurement unit maintains a detailed weight vector of each class and calculates a detailed distance vector from the detailed feature vector and the detailed weight vector. A feature distance synthesis unit calculates a synthesized distance vector by synthesizing the general distance vector and the detailed distance vector. A global classification unit determines a class of the input image based on the synthesized distance vector.


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