The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2026

Filed:

Feb. 01, 2024
Applicant:

Cape Analytics, Inc., Palo Alto, CA (US);

Inventors:

Giacomo Vianello, Mountain View, CA (US);

Peter Lorenzen, Mountain View, CA (US);

Yirui Jiang, Palo Alto, CA (US);

Assignee:

Cape Analytics, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 17/00 (2006.01); G06V 10/25 (2022.01); G06V 10/44 (2022.01);
U.S. Cl.
CPC ...
G06T 17/00 (2013.01); G06V 10/25 (2022.01); G06V 10/44 (2022.01); G06V 2201/07 (2022.01);
Abstract

In variants, the method for 3D modeling can include: determining a property of interest, determining property information for the property of interest, determining property component parameter values based on property information, determining a 3D model based on property component parameter values, and optionally determining a set of property attributes. However, the method can additionally and/or alternatively include any other suitable elements.


Find Patent Forward Citations

Vianello, Giacomo. (2026). System and method for 3d modeling (U.S. Patent No. 12743844). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12743844

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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