The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2026
Filed:
Jun. 04, 2021
Ntt, Inc., Tokyo, JP;
Yujin Hamano, Tokyo, JP;
Kazuaki Watanabe, Tokyo, JP;
Daisuke Uchibori, Tokyo, JP;
Yosuke Sakurada, Tokyo, JP;
Atsushi Aratake, Tokyo, JP;
NTT, Inc., Tokyo, JP;
Abstract
A deterioration determination device () according to the present disclosure includes an input unit () that receives an input of image data indicating an image including a figure of an inspection object, a correction unit () that generates a corrected image in which the image is corrected to increase an aspect ratio of a region surrounding the figure of at least some inspection object included in the image, a target region extraction unit () that extracts, from the corrected image, a target region indicating the figure of the inspection object included in the corrected image, a deterioration region detection unit () that detects a deterioration region indicating a figure of a deterioration portion of the inspection object from the corrected image, and a determination unit () that determines a deterioration degree of the inspection object based on the target region and the deterioration region.