The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2026
Filed:
Jan. 19, 2023
Canon Kabushiki Kaisha, Tokyo, JP;
Takashi Yabe, Chiba, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
An inspection apparatus obtains image data to be inspected by reading printed matter. When an inspection process for inspecting a defect of the printed matter is set, an inspection process on the image data to be inspected, which has been obtained by reading the printed matter, is performed based on a reference image, and when a character quality inspection process for inspecting a quality of a character of the printed matter is set, a character quality inspection process on the image data to be inspected, which has been obtained by a reading process of reading the printed matter, is performed based on the reference image. An adjustment is made to image data to be printed by a printing apparatus that generated the printed matter in accordance with an inspection result of the character quality inspection process on the image data which has been obtained by the reading process.