The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2026
Filed:
Aug. 30, 2024
Pratt & Whitney Canada Corp., Longueuil, CA;
Guy Joel Rocher, Mont-Royal, CA;
Jing Fang, Toronto, CA;
PRATT & WHITNEY CANADA CORP., Longueuil, CA;
Abstract
Systems and methods for non-destructive evaluation of components using infrared thermography are provided. A method includes mechanically exciting the component, and using an infrared sensor to acquire a thermographic image of part of the component containing a defect. Using a machine learning algorithm, a health condition of the component is determined based on the new thermographic image. The machine learning algorithm is trained using machine learning and historical data associating previous thermographic images with previous remaining service lives for the component.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile