The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2026

Filed:

Dec. 02, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Mengmeng Bai, Beijing, CN;

Li Zuo, Beijing, CN;

Wei Wen, Beijing, CN;

Lei Cao, Beijing, CN;

Xiansong Song, Beijing, CN;

Jaekeun Na, Beijing, CN;

Changwei Wang, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 5/77 (2024.01); G06T 3/4046 (2024.01); G06T 7/73 (2017.01); G06T 11/40 (2006.01); G06V 10/74 (2022.01); G06V 10/77 (2022.01);
U.S. Cl.
CPC ...
G06T 5/77 (2024.01); G06T 3/4046 (2013.01); G06T 7/74 (2017.01); G06T 11/40 (2013.01); G06V 10/761 (2022.01); G06V 10/7715 (2022.01); G06T 2207/20021 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2210/12 (2013.01); G06T 2210/22 (2013.01);
Abstract

Methods and apparatuses for performing image processing using artificial intelligence are provided. In an embodiment, an image processing method includes acquiring a target image based on an editing operation on an original image, performing a filling processing operation on the target image to obtain a first filled image including a first target region, identifying a target patch based on the first filled image, calculating a similarity value between the target patch and at least one patch related to the first filled image using a first artificial intelligence (AI) model, determining a target residual patch corresponding to the target patch based on the similarity value and generating a processing result image based on the target residual patch.


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