The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2026
Filed:
Mar. 14, 2023
Ionq, Inc., College Park, MD (US);
Ismail Volkan Inlek, Kensington, MD (US);
Michael Lurie Goldman, University Park, MD (US);
IonQ, Inc., College Park, MD (US);
Abstract
Aspects of the present disclosure relate generally to systems and methods for use in the implementation and/or operation of quantum information processing (QIP) systems, including trapped-ion QIP systems. A technique is described in which it is possible to detect at the end of a computational sequence whether an ion has undergone a transition to a state outside a computational subspace, which can only happen because of a spontaneous emission event or other error, referred to as subspace leakage errors. By detecting instances in which the ion finishes the computation outside the computational subspace and subsequently rejecting the results of those specific runs, it is possible to mitigate some or all of the infidelity caused by the subspace leakage errors.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile