The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2026

Filed:

Mar. 15, 2023
Applicant:

Triad National Security, Llc, Los Alamos, NM (US);

Inventors:

Adam Joseph Wachtor, Santa Fe, NM (US);

Eric Brian Flynn, Santa Fe, NM (US);

Erica Marie Jacobson, Los Alamos, NM (US);

Ian Thomas Cummings, Los Alamos, NM (US);

Joshua David Eckels, Ann Arbor, MI (US);

Isabel Faith Fernandez, Atlanta, GA (US);

Kelly Ho, Seattle, WA (US);

Assignee:

TRIAD NATIONAL SECURITY, LLC, Los Alamos, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/82 (2022.01); G06N 3/0464 (2023.01); G06N 3/096 (2023.01);
U.S. Cl.
CPC ...
G06N 3/096 (2023.01); G06N 3/0464 (2023.01);
Abstract

A method and system employing deep learning techniques improves processing speed and spatial resolution of acoustic wavenumber spectroscopy (ASSESS) techniques by performing semantic segmentation on simulated ultrasonic wavefield images of a steady-state, select-tone excitation of a structural or mechanical component. One or more embodiments may employ a convolutional neural network (CNN), pre-trained on openly-available datasets, and trained by transfer learning on an augmented wavefield dataset, to localize and characterize defects or damage from inspection measurements of components.


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