The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2026
Filed:
Oct. 22, 2024
Sap SE, Walldorf, DE;
Zhidong Ke, Sunnyvale, CA (US);
Utsavi Benani, Fremont, CA (US);
Aaron Zhang, Richmond Hill, CA;
Jeffrey Hajewski, Olympia, WA (US);
Nicolai Benz, Mountain View, CA (US);
SAP SE, Walldorf, DE;
Abstract
An enterprise Retrieval-Augmented Generation ('RAG') system may be associated with at least one Large Language Model (“LLM”). A test dataset may include questions, context information, and ground truth answers. An enterprise RAG evaluation framework, coupled to the test dataset and the enterprise RAG system, iteratively perform the following process until an evaluation threshold is satisfied: determine an RAG generation metric score, determine an RAG retrieval metric score, determine an end-to-end RAG metric score, and automatically adjust at least one RAG turning parameter. When the evaluation threshold is satisfied, the framework may output a metrics report including the RAG generation metrics scores, the RAG retrieval metrics scores, and end-to-end RAG metrics scores.