The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2026

Filed:

Jul. 27, 2023
Applicant:

Rosemount Aerospace Inc., Burnsville, MN (US);

Inventors:

Mark S. Miller, Lakeville, MN (US);

Phillip Acott, Burnsville, MN (US);

Assignee:

Rosemount Aerospace Inc., Burnsville, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01S 17/95 (2006.01); G01P 5/26 (2006.01); G01P 13/02 (2006.01); G01S 7/481 (2006.01); G01S 17/58 (2006.01);
U.S. Cl.
CPC ...
G01S 17/95 (2013.01); G01P 5/26 (2013.01); G01P 13/025 (2013.01); G01S 7/4814 (2013.01); G01S 7/4816 (2013.01); G01S 17/58 (2013.01);
Abstract

Apparatus and associated methods relate to improving measurement of metrics determined by laser air-data systems subject to unwanted background light. Such measurements are improved by estimating and excising the unwanted background light from the total light received by an optical receiver which receives a Doppler-shifted reflected portion of a projected beam of light backscattered by aerosols and air molecules of an atmosphere. The background light is estimated using a background-light rejection filter that separates the light received by the optical receiver into a beam sampling portion and a complementary non-beam portion. The beam sampling portion has band-pass wavelengths that include the Doppler-shifted reflected portion and a portion of the unwanted background light. The complementary non-beam portion includes background light of wavelengths outside of the band-pass wavelengths of the beam sampling portion. The non-beam sampling portion is used to estimate the unwanted background light included in the beam sampling portion.


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