The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2026

Filed:

Sep. 11, 2023
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Oki Gunawan, Westwood, NJ (US);

Ching-Tzu Chen, Ossining, NY (US);

Josephine Monica, Ithaca, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2020.01); G01R 31/28 (2006.01); H10P 74/00 (2026.01); H10P 74/20 (2026.01);
U.S. Cl.
CPC ...
G01R 31/2648 (2013.01); G01R 31/26 (2013.01); G01R 31/2601 (2013.01); G01R 31/2831 (2013.01); H10P 74/20 (2026.01); H10P 74/207 (2026.01); H10P 74/277 (2026.01);
Abstract

A method, system, and a computer program product characterize a semiconductor. The method includes receiving longitudinal and transverse magnetoresistance measurements of a sample with first and second channels in a parallel magnetic field and receiving longitudinal and transverse magnetoresistance measurements of the sample in a perpendicular magnetic field. The method also includes subtracting the magnetoresistances measured in the parallel magnetic field from the magnetoresistances measured in the perpendicular field to obtain longitudinal and transverse magnetoresistance values Rand R. The method further includes determining, based on the values Rand R, harmonic magnetoresistance coefficients a, and a, b, and b. A method and system for semiconductor testing and characterization are disclosed as well.


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