The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2026

Filed:

Jun. 03, 2024
Applicant:

Yttek Technology Corp., Hsinchu County, TW;

Inventors:

Fang-Yao Kuo, Hsinchu County, TW;

Wen-Chiang Chen, Hsinchu City, TW;

Hao-Ju Huang, Taoyuan City, TW;

Assignee:

YTTEK TECHNOLOGY CORP., Hsinchu County, TW;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01); G01R 29/10 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0821 (2013.01); G01R 29/0871 (2013.01); G01R 29/0878 (2013.01); G01R 29/0892 (2013.01); G01R 29/10 (2013.01);
Abstract

A system for measuring a signal pattern includes: a first reflector including a first reflector surface configured to generate a plane wave; a second reflector including a second reflector surface configured to generate a plane wave; a path-guiding member coupled to the first reflector and the second reflector, and configured to move the first reflector and the second reflector along a predetermined path; a stage configured to hold a device under test (DUT); and a first signal transceiver configured to transmit a signal to, or receive the signal from, at least one of the first reflector, the second reflector and the DUT.


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