The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2026
Filed:
Nov. 16, 2025
Olum Material Corporation, Yongin-si, KR;
Taek Yong Jang, Seongnam-si, KR;
Jae Seob Lee, Seoul, KR;
Woo Suk Choi, Hanam-si, KR;
Mu Gyeom Kim, Pyeongtaek-si, KR;
Olum Material Corporation, Yongin-si, KR;
Abstract
Provided are a semiconductor test device and a semiconductor test system. The semiconductor test device for testing an electrical connection of a semiconductor includes a membrane portion including a first surface and a plurality of aperture patterns extending toward a direction of a second surface opposite to the first surface, wherein the membrane portion includes a metal thin-film portion including the plurality of aperture patterns; and an insulating layer portion having an insulating material coated on a surface of the metal thin-film portion, a conductive thin-film layer is formed on a side surface of each of the plurality of aperture patterns so that adjacent aperture patterns are insulated from each other and an electrical connection path is established from the top to the bottom of each of the plurality of aperture patterns.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile