The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 2026

Filed:

Feb. 06, 2024
Applicant:

Thermo Finnigan Llc, San Jose, CA (US);

Inventors:

Michael P. Goodwin, Santa Clara, CA (US);

Michael W. Senko, Sunnyvale, CA (US);

Assignee:

Thermo Finnigan LLC, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/72 (2006.01); B01D 15/36 (2006.01); H01J 49/42 (2006.01); G01N 30/02 (2006.01);
U.S. Cl.
CPC ...
G01N 30/7233 (2013.01); B01D 15/36 (2013.01); H01J 49/421 (2013.01); H01J 49/425 (2013.01); G01N 2030/027 (2013.01);
Abstract

A system for charge detection mass spectrometry (CDMS) performs a process including subdividing an m/z range of interest into a plurality of m/z windows; determining an ion population control parameter for each m/z window; accumulating, in the ion store by one or more accumulation events, a population of ions derived from a sample; transferring the population of ions to a mass analyzer; and mass analyzing the population of ions to acquire a CDMS spectrum of the population of ions. Each accumulation event corresponds to a distinct m/z window of the plurality of m/z windows. The ion population control parameter for each m/z window regulates a quantity of ions accumulated in an ion store during an accumulation event. During each accumulation event, ions within the m/z window corresponding to the accumulation event are accumulated in the ion store based on the ion population control parameter for the corresponding m/z window.


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