The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 22, 2026
Filed:
Sep. 27, 2024
Schlumberger Technology Corporation, Sugar Land, TX (US);
Kai Hsu, Sugar Land, TX (US);
Hua Chen, Sugar Land, TX (US);
Richard Jackson, Houston, TX (US);
Evgeniya Deger, Sugar Land, TX (US);
Schlumberger Technology Corporation, Sugar Land, TX (US);
Abstract
In some embodiments, a process can include obtaining a first formation fluid sample using a sample-line of a focused fluid sampling system and obtaining a second formation fluid sample using a guard-line of the focused fluid sampling system. The process can also include measuring a first optical density spectrum of the first formation fluid sample and measuring a second optical density spectrum of the second formation fluid sample. The process can also include decolorizing the first and second optical density spectrums to produce a decolorized first spectrum and a decolorized second spectrum, respectively. The process can also include normalizing the first and second decolorized spectrums to provide a first normalized spectrum and a second normalized spectrum. The process can also include determining a difference between the first and the second normalized spectrums to provide a sampling difference and adjusting a fluid sampling operation based on the sampling difference.